HVS – High Voltage Source/Measure Unit

Features

  • Programmable Four-Quadrant Voltage and Current source and measure unit.
  • -320V to +320V Voltage Range.
  • -2A to +2A Continuous Current.
  • Capable of up to 10A pulsed current.
  • High B/W Measure unit at 10 MS/s.
  • Fully programmable.
  • Built-in Function generator.
  • Customizable clamping parameters.
  • Supports Serial, USB and LXI interfaces.
  • Fully modular design allowing for custom configuration with multiple options of output power, interfaces and software features according to customer needs.

Applications

  • Production floor tester: Rapid characterization of semiconductors with Pass/Fail option.
  • Standalone supply: Configurable as bench power supply for wide range of operations.
  • Tester power supply: Can be interfaced with major multipin/multisite semiconductor tests.

Fast FPGA based digital control loop

Advantages of digital control loop

  • Ultra fast DAC and ADC arrays for smooth output waveform control.
  • Predictive dynamic loop based on load
  • On-the-fly variation of feedback conditions
  • Fast and smooth settling times.
  • Optimizable output speed for overshoot prevention.
  • Complex array of compensation network for compatibility with many applications.

Specifications

  • Temperature range: 22.5°C ±2.5°C
  • Operating humidity: 20% to 60%
  • Warm-up time: 20 to 30 min
  • Calibration period: 6 months
  • Power supply: 230 Vac/50Hz
  • Power consumption: 130W (max 325W)
RangeResolutionAccuracy
100mV10μV0.05%
1V100μV0.05%
10V1mV0.05%
100V10mV0.05%
320V100mV0.2%
10nA1pA1%
1μA100pA0.1%
1mA100nA0.05%
100mA10μA0.1%
10A1mA0.2%