Training IC-Test

Training, Books and Concepts with

The Fundamentals of Mixed Signal Testing” explains the concepts and methodologies of testing mixed signal devices using ATE equipment. The instrumentation of a Mixed Signal Test System are introduced, with emphasis on the DSP (digital signal processing) capabilities. The mathematics necessary to fully understand signal sampling and waveform synthesis is clearly explained.

Fundamentals of Digital Semiconductor Testing Text” Soft Test offers a complete reference book and traing which details the concepts and techniques used in testing digital semiconductors. DC, AC, Functional, and Structural tests are explained in detail. Various test methods are discussed and illustrated along with the advantage and disadvantage of each method.The “Hows and Whys” of each DC test are explained.

Fundamentals of Memory Testing
This text focuses on the Fundamentals of Memory Component Test using ATE. It is intended for use by Test, Product and Applications Engineers. The material addresses the issues of algorithmic patterns and their use for fault detection within memory devices. The ability of each unique pattern to detect Specific Fault Types and the advantages and disadvantages associated with each pattern are discussed.

DFT and Simulation Testing Techniques for Digital Test” Test and Product Engineers often work with Design for Test (DFT) enabled chip designs without a clear understanding of the embedded Design for Test circuitry or the functions of the Test Vector Patterns. This text presents an overview of common DFT logic, DFT test issues, and methods of Test Vector Generation. Introductions to Simulation, Fault Models, and Automatic Test Pattern Generation (ATPG) are also included. The text consists of two main topics: Design for Test Circuitry and Simulation/Vector Generation. DFT is addressed first, then simulation and test vector generation follows.